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Rebuilt FET IGBT Transistor Diode Testers - Power Semiconductor Test

Rebuilt Power Semiconductor Testers

• Windows® 10 Operating System 

• USB 2.0 Tester Interface
  

Breakdown Voltages, Leakage Currents, Saturation, On-State, Off-State, Gain, HFE, DC, AC, RDS On, Curve Tracer

Lorlin® manufacturers New and Rebuilt Discrete Component Semiconductor Test Systems for Transistors, Diodes, Zeners, Fets, IGBTs, SCRs, Triacs, Optos, Small Signal and Power Semiconductors.   We measure, screen, test,  analyze, characterize and sort the critical parameters of semiconductors devices including Leakage Current, Breakdown Voltage, Gain, Saturation Voltages, and offer a comprehensive test parameter library with an easy to use Windows based applications software.   The systems us a Windows 10® 64-BIT Operating System with a USB 2.0 Interface. Engineering excellence, innovation, creativity and cutting edge technology has made Lorlin equipment well known for testing discrete components.    

Customers can test components in bulk or large quantities of unknown part numbers and sort them by the most expensive highest rated or desired parts of the day by using our special sorting classifying and priority order part number software yielding the most profitable results for distributors and manufacturers.

Lorlin® Reconditioned Systems Datasheet

Lorlin Tester Brouchure

Reconditioned Lorlin® Impact 7BT for Sale

Lorlin Reconditioned Impact 7BT Tester for Sale

• PC Included wih Windows 10 Testing Software
  
• Lorlin® Application Test Solutions
• Powerful Software Tools
• Debug Allows Test and Changes by Parameter
• Accept, Retest, Reject Test Data and Maintain SN
• Columnar Printout Format by Test Parameter
  
• Statistical Analysis of Data
• Hi-Rel Pre/Post Comparisions
• Data Conversion to Excel
• Software Licenses
• 600 Volts, 20 Amps Standard
  
• Expands up to 2KV and 400 Amps
• Front Panel Manual Test Station
• Lorlin Certified Factory Reconditioned
• Extended Check-Out and Burn-In
• Calibrated with Certificate
• One Year Warranty Standard
  SN 4224

Reconditioned Options Available:

• Higher Voltage
• Higher Current
• Power FET
• AC 1Khz
• Test Fixtures
• Performance Test Fixture
• Spare Boards Kit
• Additional Test Stations

sales@lorlin.com

631-392-1385 Voice      631-940-8455  Fax

Reconditioned Lorlin Impact 7BT shown above with a Windows 10 Laptop

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Reconditioned Lorlin® Impact Series Tester 

Lorlin Reconditioned Impact Series Tester for Sale

• PC Included with Lorlin Windows Testing Software
• Upgradeable to Windows 7, 8 or 10©
• Lorlin® Testing Software
• Software License
• 600 Volts, 20 Amps Standard
  
• Expands up to 2KV and 400 Amps
• Manual Test Station
• Factory Reconditioned
• Calibrated with Certificate
• One Year Warranty
  

Reconditioned Options Available:

• Lorlin Windows 7, 8, 10 Upgrade Package
• Higher Voltage
• Higher Current
• Power FET
• AC 1Khz
• Test Fixtures
• Performance Test Fixture
• Spare Boards Kit
• Additional Test Station

sales@lorlin.com

631-392-1385 Voice      631-940-8455  Fax

Reconditioned Lorlin Impact 7BT shown above with a Windows 10 Laptop

FACTORY REBUILT LORLIN® TESTERS Lorlin® offers the most affordable small signal and power semiconductor test solutions on the market with capabilities that excel above and beyond any competitor.  Speed, Accuracy, Repeatability, Functionality.  Lorlin gives you the best price and superior performance. Up to 2000 Volts Standard, Higher Voltages Available Up to 500 Amps Standard, Higher Currents Available The Double-Impact Tester for Small Signal and Power Semiconductors Test, Measure, Analyze, Characterize, Sort, Classify

Lorlin® Double Impact Factory Rebuilt Systems offer 600Volts, 20 Amps, and 5 picoamp resolution for Small Signal and Power Semiconductors as standard and will test, measure, characterize, grade,  verify, analyze, sort and classify your discrete semiconductor components.  Lorlin® can configure rebuilt systems  for applications up to 2000 Volts, 500 Amps and three test stations for manual or automatic testing with wafer probers and  handlers. Includes the latest Lorlin© 7+ Windows Software License® and a One Year Warranty.

Lorlin® Double Impact Brochure PDF

Lorlin® Double-Impact Datasheet

FACTORY REBUILT TEST STATIONS

200,400,500 Amp High Current Test Stations

2000 Volt Rebuilt Test Station

SS100 and SS150 FET Device Array, Opto and Hybrid Super Stations The SS150 offers ultra low leakage current capability in the femtoamp region    SS-150 Application Note On Low Leakage Measurements

Lorlin offers power semiconductor testers for up to 2000 Volts  and 500 Amps

Lorlin's product line of high performance semiconductor component testing equipment provides the best quality at affordable prices.  Lorlin semiconductor device testers are used in all component test applications including incoming inspection, quality control, engineering, wafer probe, and production final test.  Lorlin has supplied semiconductor test equipment for over 50 years.   A historic test system leader with Reliable, Accurate, and Repeatable results.

Lorlin Test Systems has been selling testers since 1964 and highly regarded as the  world experts  in the science and specialized technology of advanced testing, measurement, analysis and characterization of discrete semiconductor component devices.  Our  technology and capabilities are advanced as a result of years of engineering excellence, innovation,  and creativity.