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MOSFET IGBT Diode BJT Test

Small Signal and Power Discrete Component Semiconductor Testers

Transistors, Darlingtons, Diodes, FETs, MOSFETs, Jfets, Zeners, Rectifiers, Bridges, IGBTs, SCRs, Triacs, Opto-Coupled Devices, Hybrids, Arrays Test, Measure, Analyze, Characterize, Sort, Classify, Screen, Grade Device, Parametric Testing of Leakage Current, Breakdown Voltage, Gain, AC, On-State Tests, Off-State Tests, Saturation Voltage, Impedance, Transconductance, Capacitance, and More

 

 

 



The Lorlin© Impact Series 

Discrete Component Tester is designed to test small signal and power semiconductor components in both single and  multi-device packages or hybrids..   The  automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability.  The system tests most all discrete semiconductors with reliable, accurate, and repeatable results. 

Customers can test components in bulk or large quantities of unknown part numbers and sort them by the  highest valued or desired parts of the day by using our special sorting classifying and priority order part number software yielding the most profitable results for distributors and manufacturers.

Impact Series Datasheet

Lorlin Impact Series

  • 2000 Volts Standard
  • Higher Voltages Available
  • 20 to 500 Amps Standard
  • Higher Currents Available
  • DC, AC & Dynamic Test Capability
  • Power Semiconductor Test for IGBT, MOSFET and Many Others
  • 3 Station Capability (Expandable to 5 Test Stations)
  • High Voltage, High Current in Single Device Insertion
  • Handler & Prober Interfaces
  • Windows 10© 64-BIT OS PC Applications Software
  • Fast and Accurate
  • Hybrid, Array Station Options
  • Custom Fixtures and Services
  • Extensive Device Parameter Test Library
  • Custom Component Test Programming Services
  • Free Technical Support

       Lorlin Tester Brochure     

Standard Specifications

Impact Series

System Resource

 

Value

Ranges

Accuracy

 

High Voltage Supplies

0 to +/- 600 V

+200 to +2000V

200 V

2000 V

0.5% + 50mV + 2mV/mA

0.5% + 500mV + 3mV/mA

Low Voltage VX Gate Supply

0 to +/- 80 V

20 V, 200 V

0.5% + 50 amV

Current Supplies

B E C

0 to 20 A

20A to 200A

200 nA to 20 A

200A

0.5% + 50nA

1% + 1 digit

Voltage Measure

0 to +/- 20 V

2 V, 20 V

0.5% + 1mV + 1mV/A

 

Current Measure

 

0 to 200 mA

0 to 20 nA

20 nA to 200 mA

200 pA to 20 nA

0.5% + 100 pA + 2 pA/V

2% + 5 pA + 0.1 pA/V

Programmable Resistor E-B

 

0 to 20 K Ohm

1

1.0%

Breakdown Voltages, Leakage Currents, Saturation, On-State, Off-State, Gain, HFE, DC, AC and Dynamic Component Test Parameters

 Impact Series System Block Diagram

Impact Series Typical System Configuration

Impact Series System Compliance Charts


A variety of test stations can accommodate almost any application including incoming inspection, final test, wafer probe, quality control, and component characterization. The tester is controlled by a PC operating under Windows 10 64-BIT with the Lorlin PC Application Software Package. 

Over 50 years of engineering excellence, innovation, creativity and advanced technology is what made Lorlin testers so popular in the industry.  Proven out test designs, repeatability, stability, accuracy are among the many reasons so many test engineers specify Lorlin.  The Impact Series tester is a result of the years of dedication to research and development.  Both new and factory rebuilt  units are available with the same warranty, specifications and licensed Impact Series software.  Lorlin  systems have tested billions of parts throughout the world and remain the number one source for testing small signal and power semiconductor components. 

Lorlin Test Systems® manufactures and distributes semiconductor component test systems. Through years of dedicated engineering excellence, proven designs, and achievements, Lorlin is proud to maintain the leading cutting edge technology offered in our products. Lorlin's dynamic and encompassing solutions are tailored to customers specific needs and requirements for virtually any test application.

Proven superior and advanced analog and digital electronics engineering designs for over 40 years utilizing advanced circuitry and technology is why Lorlin products are so desired by engineers.  Our visions of the research and development needed to meet the demands of today were realized years ago. 

Smooth, flawless and flowing engineering design excellence have yielded success, complete customer satisfaction and overwhelming confidence in Lorlin's equipment performance. Our test concepts have been developed in an environment of creative flux and intuition with achievements unsurpassed.

Our flexibility and creativity enable us to fulfill your application desires and targeted test and manufacturing goals while staying within your budget. The parametric testing equipment is used to test, evaluate and analyze the electrical characteristics of semiconductor devices in component testing and semiconductor manufacturing applications such as production and final test, wafer probe and wafer mapping, QC & QA test, incoming inspection, engineering evaluation and characterization, high reliability, and high volume testing.

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